| Literature DB >> 18337884 |
B T Sullivan1, G A Clarke, T Akiyama, N Osborne, M Ranger, J A Dobrowolski, L Howe, A Matsumoto, Y Song, K Kikuchi.
Abstract
A previously described automated thin-film deposition system based on rf-magnetron sputtering could deposit quite complex optical multilayer systems with good precision and with no one in attendance [Sullivan and Dobrowolski, Appl. Opt. 32, 2351-2360 (1993)]. However, the deposition rate was slow, and the uniform area on the substrate was limited. We describe an ac-magnetron sputtering process in which the same deposition accuracy has been combined with significantly better film uniformity and a fivefold or sevenfold increase in the deposition rate. This makes the equipment of commercial interest. Experimental results are presented for several difficult coating problems.Entities:
Year: 2000 PMID: 18337884 DOI: 10.1364/ao.39.000157
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980