Literature DB >> 18324164

Polarization characteristics of Spectralon illuminated by coherent light.

D A Haner1, B T McGuckin, C J Bruegge.   

Abstract

The Multiangle Imaging Spectroradiometer makes use of an onboard calibration system that includes two Spectralon panels that are used to reflect sunlight into the cameras. During preflight testing, these panels were quantified in terms of their bidirectional reflectance distribution function, which was measured as a function of the source-incident and detector view angles and at laser wavelengths of 442.0, 632.8, and 859.9 nm. Principal plane measurements are presented in which polarizations of the source and detector are analyzed. These data are unique and valuable in modeling Spectralon reflectance properties and for experiments in which polarization sensitivities are important.

Year:  1999        PMID: 18324164     DOI: 10.1364/ao.38.006350

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  3 in total

1.  Polarization properties of FEL lamps as applied to radiometric calibration.

Authors:  Kenneth J Voss; Leonardo Belmar da Costa
Journal:  Appl Opt       Date:  2016-11-01       Impact factor: 1.980

2.  Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene.

Authors:  Thomas A Germer
Journal:  Appl Opt       Date:  2017-11-20       Impact factor: 1.980

3.  Polarised multiangular reflectance measurements using the finnish geodetic institute field goniospectrometer.

Authors:  Juha Suomalainen; Teemu Hakala; Jouni Peltoniemi; Eetu Puttonen
Journal:  Sensors (Basel)       Date:  2009-05-22       Impact factor: 3.576

  3 in total

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