| Literature DB >> 18324124 |
Abstract
The measured optical-constant errors that arise in the Kretschmann configuration from surface roughness have been analyzed. The broadening of the half-width and the change in the reflection minimum of the attenuated-total-reflection curve that are due to the surface roughness are described. Calculation of the correct optical constants and silver-film thickness is demonstrated.Year: 1999 PMID: 18324124 DOI: 10.1364/ao.38.006029
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980