Literature DB >> 18286126

In-line digital holographic interferometry.

G Pedrini, P Fröning, H Fessler, H J Tiziani.   

Abstract

An optical system based on in-line digital holography for the evaluation of deformations is described. In-line holograms are recorded on a CCD chip. The problem of overlapping twin images typical for the in-line arrangement is solved by digital reconstruction and filtering of the unwanted wave fronts. Two separate interferograms of an object under test in its undeformed and deformed states are recorded each on a CCD chip. The phases of the two wave fronts are obtained from the complex amplitudes of the digital reconstructed wave fronts, and the deformation is calculated from the phase differences. Experimental results are presented.

Entities:  

Year:  1998        PMID: 18286126     DOI: 10.1364/ao.37.006262

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  1 in total

1.  On-chip Microscopy Using Random Phase Mask Scheme.

Authors:  Anwar Hussain; Yicheng Li; Diyi Liu; Cuifang Kuang; Xu Liu
Journal:  Sci Rep       Date:  2017-11-07       Impact factor: 4.379

  1 in total

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