Literature DB >> 18257578

Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor.

Masatomo Yashima1, Makiko Enoki, Takahiro Wakita, Roushown Ali, Yoshitaka Matsushita, Fujio Izumi, Tatsumi Ishihara.   

Abstract

MEM nuclear density analysis from neutron diffraction data measured in situ at 1015.6 degrees C has indicated the two-dimensional network of curved O2-O3-O2 oxide-ion diffusion paths on the (Pr,La)-O layer in a K2NiF4-type structured oxide-ionic and electronic mixed conductor (Pr0.9La0.1)2(Ni0.74Cu0.21Ga0.05)O4+delta.

Entities:  

Year:  2008        PMID: 18257578     DOI: 10.1021/ja711478h

Source DB:  PubMed          Journal:  J Am Chem Soc        ISSN: 0002-7863            Impact factor:   15.419


  2 in total

1.  Signature of Oxide-Ion Conduction in Alkaline-Earth-Metal-Doped Y3GaO6.

Authors:  Pragati Singh; Raghvendra Pandey; Tadeusz Miruszewski; Kacper Dzierzgowski; Aleksandra Mielewczyk-Gryn; Prabhakar Singh
Journal:  ACS Omega       Date:  2020-11-16

2.  Oxide-ion conduction in the Dion-Jacobson phase CsBi2Ti2NbO10-δ.

Authors:  Wenrui Zhang; Kotaro Fujii; Eiki Niwa; Masato Hagihala; Takashi Kamiyama; Masatomo Yashima
Journal:  Nat Commun       Date:  2020-03-06       Impact factor: 14.919

  2 in total

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