| Literature DB >> 18238271 |
P V Sankar, O Nalcioglu, J Sklansky.
Abstract
A detailed error analysis for the dual-sampling region-ofinterest X-ray tomography is presented. Simulation studies are used along with a range of sampling rates to quantitate the amount of sampling errors within the region of interest. It is shown that as the rate of sampling outside the region of interest becomes sparse the amount of sampling errors within the region of interest increases considerably.Year: 1982 PMID： 18238271 DOI： 10.1109/TMI.1982.4307568
Source DB: PubMed Journal: IEEE Trans Med Imaging ISSN： 0278-0062 Impact factor: 10.048