Authors: Lee A D Cooper; Alexis B Carter; Alton B Farris; Fusheng Wang; Jun Kong; David A Gutman; Patrick Widener; Tony C Pan; Sharath R Cholleti; Ashish Sharma; Tahsin M Kurc; Daniel J Brat; Joel H Saltz Journal: Proc IEEE Inst Electr Electron Eng Date: 2012-04 Impact factor: 10.961