| Literature DB >> 17971272 |
Joost R van Ginkel1, L Andries van der Ark, Klaas Sijtsma.
Abstract
Multiple imputation under a two-way model with error is a simple and effective method that has been used to handle missing item scores in unidimensional test and questionnaire data. Extensions of this method to multidimensional data are proposed. A simulation study is used to investigate whether these extensions produce biased estimates of important statistics in multidimensional data, and to compare them with lower benchmark listwise deletion, two-way with error and multivariate normal imputation. The new methods produce smaller bias in several psychometrically interesting statistics than the existing methods of two-way with error and multivariate normal imputation. One of these new methods clearly is preferable for handling missing item scores in multidimensional test data.Mesh:
Year: 2007 PMID: 17971272 DOI: 10.1348/000711006X117574
Source DB: PubMed Journal: Br J Math Stat Psychol ISSN: 0007-1102 Impact factor: 3.380