| Literature DB >> 1786335 |
Abstract
Diggle (1989, Biometrics 45, 1255-1258) proposes a test for random dropouts in repeated measurement data when the experiment has a completely randomized design. It is argued here that logistic regression is a comparable but more flexible technique for studying the occurrence of dropouts.Mesh:
Year: 1991 PMID: 1786335
Source DB: PubMed Journal: Biometrics ISSN: 0006-341X Impact factor: 2.571