Literature DB >> 17842673

Strained-layer epitaxy of germanium-silicon alloys.

J C Bean.   

Abstract

Despite the dominant position of silicon in semiconductor electronics, its use is ultimately limited by its incompatibility with other semiconducting materials. Strained-layer epitaxy overcomes problems of crystallographic compatibility and produces high-quality heterostructures of germanium-silicon layers on silicon. This opens the door to a range of electronic and photonic devices that are based on bandstructure physics.

Entities:  

Year:  1985        PMID: 17842673     DOI: 10.1126/science.230.4722.127

Source DB:  PubMed          Journal:  Science        ISSN: 0036-8075            Impact factor:   47.728


  1 in total

1.  Depth profiles of the interfacial strains of Si0.7Ge0.3/Si using three-beam Bragg-surface diffraction.

Authors:  Yan-Zong Zheng; Yun-Liang Soo; Shih-Lin Chang
Journal:  Sci Rep       Date:  2016-05-09       Impact factor: 4.379

  1 in total

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