| Literature DB >> 17831502 |
J E Berger, C R Zobel, P E Engler.
Abstract
Fourier analysis of electron micrographs has been accomplished underptimum conditions with a gas laser as the light source for an optical diffractometer.Year: 1966 PMID: 17831502 DOI: 10.1126/science.153.3732.168
Source DB: PubMed Journal: Science ISSN: 0036-8075 Impact factor: 47.728