Literature DB >> 17809494

Application of High-Resolution Semiconductor Detectors in X-ray Emission Spectrography.

H R Bowman, E K Hyde, S G Thompson, R C Jared.   

Abstract

Solid-state devices developed primarily for nuclear gamma spectroscopy have many potential uses in x-ray analysis.

Year:  1966        PMID： 17809494     DOI： 10.1126/science.151.3710.562

Source DB:  PubMed          Journal:  Science        ISSN： 0036-8075            Impact factor:   47.728


  2 in total

1.  Description of an XRF system for multielemental analysis.

Authors:  L Wielopolski; R Zhang; S H Cohn
Journal:  Biol Trace Elem Res       Date:  1987-08       Impact factor: 3.738

2.  A systematic method for introducing heavy atoms into a protein molecule.

Authors:  A Fenselau; D Koenig; D E Koshland; H G Latham; H Weiner
Journal:  Proc Natl Acad Sci U S A       Date:  1967-06       Impact factor: 11.205
  2 in total

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