Literature DB >> 17798744

Negative differential resistance on the atomic scale: implications for atomic scale devices.

I W Lyo, P Avouris.   

Abstract

Negative differential resistance (NDR) is the essential property that allows fast switching in certain types of electronic devices. With scanning tunneling microscopy (STM) and scanning tunneling spectroscopy, it is shown that the current-voltage characteristics of a diode configuration consisting of an STM tip over specific sites of a boron-exposed silicon(111) surface exhibit NDR. These NDR-active sites are of atomic dimensions ( approximately 1 nanometer). NDR in this case is the result of tunneling through localized, atomic-like states. Thus, desirable device characteristics can be obtained even on the atomic scale.

Entities:  

Year:  1989        PMID: 17798744     DOI: 10.1126/science.245.4924.1369

Source DB:  PubMed          Journal:  Science        ISSN: 0036-8075            Impact factor:   47.728


  4 in total

1.  Probing charge transport at the single-molecule level on silicon by using cryogenic ultra-high vacuum scanning tunneling microscopy.

Authors:  Nathan P Guisinger; Nathan L Yoder; Mark C Hersam
Journal:  Proc Natl Acad Sci U S A       Date:  2005-06-13       Impact factor: 11.205

2.  Time-resolved energy transduction in a quantum capacitor.

Authors:  Woojin Jung; Doohee Cho; Min-Kook Kim; Hyoung Joon Choi; In-Whan Lyo
Journal:  Proc Natl Acad Sci U S A       Date:  2011-08-04       Impact factor: 11.205

3.  Resonance tunneling electron-vibrational spectroscopy of polyoxometalates.

Authors:  F I Dalidchik; S A Kovalevskii; E M Balashov
Journal:  J Chem Phys       Date:  2017-05-21       Impact factor: 3.488

4.  Energy-filtered Electron Transport Structures for Low-power Low-noise 2-D Electronics.

Authors:  Xuan Pan; Wanzhi Qiu; Efstratios Skafidas
Journal:  Sci Rep       Date:  2016-10-31       Impact factor: 4.379

  4 in total

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