| Literature DB >> 17779440 |
E Betzig, J K Trautman, T D Harris, J S Weiner, R L Kostelak.
Abstract
In near-field scanning optical microscopy, a light source or detector with dimensions less than the wavelength (lambda) is placed in close proximity (lambda/50) to a sample to generate images with resolution better than the diffraction limit. A near-field probe has been developed that yields a resolution of approximately 12 nm ( approximately lambda/43) and signals approximately 10(4)- to 10(6)-fold larger than those reported previously. In addition, image contrast is demonstrated to be highly polarization dependent. With these probes, near-field microscopy appears poised to fulfill its promise by combining the power of optical characterization methods with nanometric spatial resolution.Year: 1991 PMID: 17779440 DOI: 10.1126/science.251.5000.1468
Source DB: PubMed Journal: Science ISSN: 0036-8075 Impact factor: 47.728