| Literature DB >> 17733684 |
P J Mallozzi, R E Schwerzel, H M Epstein, B E Campbell.
Abstract
The extended x-ray absorption fine structure (EXAFS) spectrum of aluminum has been measured with a nanosecond pulse of soft x-rays generated by a laser-produced plasma. This technique provides a practical alternative to synchrotorn radiation for the acquisition of EXAFS data. It also provides a unique capability for the analysis of molecular structure in highly transient chemical species.Entities:
Year: 1979 PMID： 17733684 DOI： 10.1126/science.206.4416.353
Source DB: PubMed Journal: Science ISSN： 0036-8075 Impact factor: 47.728