| Literature DB >> 17694150 |
K M Golant1, S V Lavrishchev, A V Popov, I A Artyukov, R M Feshchenko, A N Mitrofanov, A V Vinogradov.
Abstract
A new cost-efficient sputter-slice technology for hard x-ray (10-30 keV) Fresnel zone plates fabrication, imposing no limitation to aspect ratio, is proposed. By means of a plasma chemical process, SiO(2)/Si(1-x)Ge(x)O(2) glassy film multilayer structures are deposited on a lateral surface of a silica rod, outermost layers being as thin as 100 nm. It has been shown by numerical simulation that for x=0.2 germanium fraction, 100-300 microm zone plate thickness and the number of zones of about 1000, first order diffraction efficiency as high as 20%-30% at the energy of approximately 20 keV can be achieved.Entities:
Year: 2007 PMID: 17694150 DOI: 10.1364/ao.46.005964
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980