| Literature DB >> 17678120 |
Roger H Koch1, David P Divincenzo, John Clarke.
Abstract
We propose a model for 1/f flux noise in superconducting devices (f is frequency). The noise is generated by the magnetic moments of electrons in defect states which they occupy for a wide distribution of times before escaping. A trapped electron occupies one of the two Kramers-degenerate ground states, between which the transition rate is negligible at low temperature. As a result, the magnetic moment orientation is locked. Simulations of the noise produced by randomly oriented defects with a density of 5x10(17) m(-2) yield 1/f noise magnitudes in good agreement with experiments.Year: 2007 PMID: 17678120 DOI: 10.1103/PhysRevLett.98.267003
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161