Literature DB >> 17650369

Attenuated total internal reflection infrared microscopy of multilayer plastic packaging foils.

Gerard van Dalen1, Patricia C M Heussen, Ruud den Adel, Robert B J Hoeve.   

Abstract

Multilayer plastic foils are important packaging materials that are used to extend the shelf life of food products and drinks. Fourier transform infrared (FT-IR) spectroscopic imaging using attenuated total internal reflection (ATR) can be used for the identification and localization of different layers in multilayer foils. A new type of ATR crystal was used in combination with a linear array detector through which large sample areas (400 x 400 microm(2)) could be imaged with a pixel size of 1.6 microm. The method was tested on laminated plastic packing materials containing 5 to 12 layers. The results of the identification of the different materials using ATR-FT-IR were compared with differential scanning calorimetry (DSC) and the layer thickness of the individual layers measured by ATR-FT-IR was compared with polarized light microscopy (LM) and scanning electron microscopy (SEM). It has been demonstrated that individual layers with a thickness of about 3 microm could be identified in multilayer foils with a total thickness ranging from 100 to 150 microm. The results show a spatial resolution of about 4 microm (measured at wavenumbers ranging from 1000 to 1730 cm(-1)), which is about a factor of two better than can be obtained using transmission FT-IR imaging. An additional advantage of ATR is the ease of sample preparation. A good correspondence was found between visible and FT-IR images. The results of ATR-FT-IR imaging were in agreement with those obtained by LM, SEM, and DSC. ATR-FT-IR is superior to the combination of these techniques because it delivers both spatial and chemical information.

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Year:  2007        PMID: 17650369     DOI: 10.1366/000370207781269738

Source DB:  PubMed          Journal:  Appl Spectrosc        ISSN: 0003-7028            Impact factor:   2.388


  1 in total

1.  Apparatus for High-Precision Angle-Resolved Reflection Spectroscopy in the Mid-Infrared Region.

Authors:  Takashi Kuroda; Siti Chalimah; Yuanzhao Yao; Naoki Ikeda; Yoshimasa Sugimoto; Kazuaki Sakoda
Journal:  Appl Spectrosc       Date:  2020-10-12       Impact factor: 2.388

  1 in total

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