Literature DB >> 17571863

Photoionization dynamics in pure helium droplets.

Darcy S Peterka1, Jeong Hyun Kim, Chia C Wang, Lionel Poisson, Daniel M Neumark.   

Abstract

The photoionization and photoelectron spectroscopy of pure He droplets were investigated at photon energies between 24.6 eV (the ionization energy of He) and 28.0 eV. Time-of-flight mass spectra and photoelectron images were obtained at a series of molecular beam source temperatures and pressures to assess the effect of droplet size on the photoionization dynamics. At source temperatures below 16 K, where there is significant production of clusters with more than 10(4) atoms, the photoelectron images are dominated by fast electrons produced via direct ionization, with a small contribution from very slow electrons with kinetic energies below 1 meV arising from an indirect mechanism. The fast photoelectrons from the droplets have as much as 0.5 eV more kinetic energy than those from atomic He at the same photon energy. This result is interpreted and simulated within the context of a "dimer model", in which one assumes vertical ionization from two nearest-neighbor He atoms to the attractive region of the He2+ potential energy curve. Possible mechanisms for the slow electrons, which were also seen at energies below IE(He), are discussed, including vibrational autoionizaton of Rydberg states comprising an electron weakly bound to the surface of a large HeN+ core.

Entities:  

Year:  2007        PMID: 17571863     DOI: 10.1021/jp0710032

Source DB:  PubMed          Journal:  J Phys Chem A        ISSN: 1089-5639            Impact factor:   2.781


  2 in total

1.  Facile time-of-flight methods for characterizing pulsed superfluid helium droplet beams.

Authors:  Yunteng He; Jie Zhang; Yang Li; William M Freund; Wei Kong
Journal:  Rev Sci Instrum       Date:  2015-08       Impact factor: 1.523

2.  Electron impact ionization and multiphoton ionization of doped superfluid helium droplets: A comparison.

Authors:  Yunteng He; Jie Zhang; Wei Kong
Journal:  J Chem Phys       Date:  2016-02-28       Impact factor: 3.488

  2 in total

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