Photoreflectance spectroscopy with a step-scan Fourier-transform infrared spectrometer: technique and applications.

We report on a new technique of realizing photoreflectance (PR) spectroscopy with a step-scan Fourier-transform infrared spectrometer. The experimental configuration is briefly described and a detailed theoretical analysis is conducted. The results reveal two distinct features of this PR technique that (i) the PR related signal is enhanced by a factor of at least 100 relative to those of the conventional PR techniques and (ii) the unwanted spurious signal introduced by either diffuse reflected pump beam or pump-beam induced material's photoluminescence reaching the photodetector of the PR configuration is eliminated without any special consideration of normalization for deducing the final PR spectrum. Applications are given as examples in the study of GaNAs/GaAs single quantum wells and GaInP/AlGaInP multiple quantum wells, respectively, under different pump-beam excitation energy and/or power. The experimental results approve the theoretically predicted features and illustrate the possibility of investigating weak PR features by using high pump-beam power. A brief comparison of this technique with the conventional PR techniques is given, and the extendibility of this technique to long-wavelength spectral regions is pointed out.