| Literature DB >> 17481342 |
Raymond F Egerton1, Feng Wang, Peter A Crozier.
Abstract
We have investigated the changes produced in single-element and two-layer transmission electron microscope (TEM) specimens irradiated by an intense nanometer-sized electron probe, such as that produced in a field-emission or aberration-corrected TEM. These changes include hole formation and the accumulation of material within the irradiated area. The results are discussed in terms of mechanisms, including electron-beam sputtering and surface diffusion. Strategies for minimizing the effect of the beam are considered.Mesh:
Substances:
Year: 2006 PMID: 17481342 DOI: 10.1017/S1431927606060065
Source DB: PubMed Journal: Microsc Microanal ISSN: 1431-9276 Impact factor: 4.127