| Literature DB >> 17293412 |
Ralf Moeller1, Erko Stackebrandt, Günther Reitz, Thomas Berger, Petra Rettberg, Aidan J Doherty, Gerda Horneck, Wayne L Nicholson.
Abstract
The role of DNA repair by nonhomologous-end joining (NHEJ) in spore resistance to UV, ionizing radiation, and ultrahigh vacuum was studied in wild-type and DNA repair mutants (recA, splB, ykoU, ykoV, and ykoU ykoV mutants) of Bacillus subtilis. NHEJ-defective spores with mutations in ykoU, ykoV, and ykoU ykoV were significantly more sensitive to UV, ionizing radiation, and ultrahigh vacuum than wild-type spores, indicating that NHEJ provides an important pathway during spore germination for repair of DNA double-strand breaks.Entities:
Mesh:
Year: 2007 PMID: 17293412 PMCID: PMC1855867 DOI: 10.1128/JB.00018-07
Source DB: PubMed Journal: J Bacteriol ISSN: 0021-9193 Impact factor: 3.490