Literature DB >> 17278501

Development of dosimetry using detectors of diagnostic digital radiography systems.

Eiji Ariga1, Shigeki Ito, Shizuhiko Deji, Takuya Saze, Kunihide Nishizawa.   

Abstract

Dosimetry using an imaging plate (IP) of computed radiography (CR) systems was developed for quality control of output of the x-ray equipment. Sensitivity index, or the S number, of the CR systems was used for estimating exposure dose under the routine condition: exposure dose from 1.0 to 1.0 x 10(2) microC kg(-1), tube voltages from 50 to 120 kV, and added filtration from 0 to 4.0 mm Al. The IP was calibrated by using a 6 cc ionization chamber having traceability to the National Standard Ionization Chamber. The uncertainty concerning the fading effect was suppressed less than 1.9% by reading the latent image 4 min+/-5 s after irradiation at the room temperature 25.9+/-1.0 degrees C. The S number decreased linearly on the logarithmic graph regardless of the beam quality as exposure dose increased. The relationship between the exposure dose (E) and the S number was fitted by the equation E=a' X S(-b). The coefficient a' decreased when the added filtration and the tube voltage were increased. The coefficient b was 0.977+/-0.007 in all beam qualities. The dosimetry using the IP and the equation can estimate the exposure dose in a range from 9.0 x 10(-2) to 5.0 microC kg(-1) within an uncertainty of +/-5% required by the Japanese Industry Standard. This dose range partially included the doses under routine condition. The doses between 1.0 and 1.0 x 10(2) microC kg(-1) under the routine condition can be shifted to the 5% region by using an absorber. The IP dosimetry is applicable to the quality control of the CR systems.

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Year:  2007        PMID: 17278501     DOI: 10.1118/1.2402911

Source DB:  PubMed          Journal:  Med Phys        ISSN: 0094-2405            Impact factor:   4.071


  1 in total

1.  Effect of X-ray beam quality on determination of exposure index.

Authors:  Shogo Yasumatsu; Nobukazu Tanaka; Kensuke Iwase; Yoichiro Shimizu; Junji Morishita
Journal:  Radiol Phys Technol       Date:  2015-11-30
  1 in total

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