| Literature DB >> 17166000 |
Hagai Cohen1, Shaibal K Sarkar, Gary Hodes.
Abstract
Light-induced chemically resolved electrical measurements (CREM) under controlled electrical conditions are used to study photovoltaic effects at selected regions in nanocrystalline CdSe-based films. The method, based on X-ray photoelectron spectroscopy (XPS), possesses unique capabilities for exploring charge trapping and charge transport mechanisms, combining spectrally filtered input signals with photocurrent detection and with a powerful, site-selective, photovoltage probe.Entities:
Year: 2006 PMID: 17166000 DOI: 10.1021/jp0648590
Source DB: PubMed Journal: J Phys Chem B ISSN: 1520-5207 Impact factor: 2.991