Literature DB >> 17155506

Local phase decomposition as a cause of polarization fatigue in ferroelectric thin films.

X J Lou1, M Zhang, S A T Redfern, J F Scott.   

Abstract

We show that lead zirconate titanate thin films undergo local phase decomposition during fatigue. The original remanent polarization of the fatigued film is completely restored after furnace annealing in an O2 atmosphere, following a significant regrowth of a perovskite phase from the pyrochlorelike structure. By comparing our data with other researchers' work on annealing of fatigued ferroelectric samples, we conclude that local phase separation is the generic reason for electrical fatigue in ferroelectrics. A fatigue model is proposed in order to interpret our experimental data.

Entities:  

Year:  2006        PMID: 17155506     DOI: 10.1103/PhysRevLett.97.177601

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  5 in total

1.  Polarization Fatigue in Pb(In(0.5)Nb(0.5))O(3)-Pb(Mg(1/3)Nb(2/3))O(3)-PbTiO(3) Single Crystals.

Authors:  Shujun Zhang; Jun Luo; Fei Li; Richard J Meyer; Wesley Hackenberger; Thomas R Shrout
Journal:  Acta Mater       Date:  2010-06-01       Impact factor: 8.203

2.  Influence of the Template Layer on the Structure and Ferroelectric Properties of PbZr0.52Ti0.48O3 Films.

Authors:  Philip Lucke; Mohammadreza Nematollahi; Muharrem Bayraktar; Andrey E Yakshin; Johan E Ten Elshof; Fred Bijkerk
Journal:  ACS Omega       Date:  2022-06-17

3.  Ferroelectric memory based on nanostructures.

Authors:  Xingqiang Liu; Yueli Liu; Wen Chen; Jinchai Li; Lei Liao
Journal:  Nanoscale Res Lett       Date:  2012-06-01       Impact factor: 4.703

4.  Polarization fatigue of organic ferroelectric capacitors.

Authors:  Dong Zhao; Ilias Katsouras; Mengyuan Li; Kamal Asadi; Junto Tsurumi; Gunnar Glasser; Jun Takeya; Paul W M Blom; Dago M de Leeuw
Journal:  Sci Rep       Date:  2014-05-27       Impact factor: 4.379

5.  Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors.

Authors:  M T Do; N Gauquelin; M D Nguyen; J Wang; J Verbeeck; F Blom; G Koster; E P Houwman; G Rijnders
Journal:  Sci Rep       Date:  2020-04-30       Impact factor: 4.379

  5 in total

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