Literature DB >> 17115726

Excess electrons stabilized on ionic oxide surfaces.

Mario Chiesa1, Maria Cristina Paganini, Elio Giamello, Damien M Murphy, Cristiana Di Valentin, Gianfranco Pacchioni.   

Abstract

Surface excess electrons are remarkable chemical entities that provide great opportunities for the design of new materials with precisely tuned electronic and magnetic properties. In this Account, we describe the structure and electronic properties of excess electron centers generated at the surface of insulating oxides. We also outline the elementary mechanisms that are at the basis of the generation of excess electrons at solid surfaces, setting a comparison to the general problem of excess electron localization in condensed media. Emphasis is given to morphological aspects relative to the surface-trapping sites as deduced from combined electron paramagnetic resonance and accurate quantum chemical calculations. The remarkable reactivity featured by the so formed "electron-rich" surfaces is illustrated, describing the reduction of simple diatomic molecules that form adsorbed radical anions via direct surface to adsorbate electron transfer.

Entities:  

Year:  2006        PMID: 17115726     DOI: 10.1021/ar068144r

Source DB:  PubMed          Journal:  Acc Chem Res        ISSN: 0001-4842            Impact factor:   22.384


  4 in total

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Authors:  Elio Giamello
Journal:  Nat Chem       Date:  2012-11       Impact factor: 24.427

2.  Hydride ions in oxide hosts hidden by hydroxide ions.

Authors:  Katsuro Hayashi; Peter V Sushko; Yasuhiro Hashimoto; Alexander L Shluger; Hideo Hosono
Journal:  Nat Commun       Date:  2014-03-24       Impact factor: 14.919

3.  Electronic and chemical properties of a surface-terminated screw dislocation in MgO.

Authors:  Keith P McKenna
Journal:  J Am Chem Soc       Date:  2013-12-05       Impact factor: 15.419

4.  Modification of Charge Trapping at Particle/Particle Interfaces by Electrochemical Hydrogen Doping of Nanocrystalline TiO2.

Authors:  Juan M Jiménez; Gilles R Bourret; Thomas Berger; Keith P McKenna
Journal:  J Am Chem Soc       Date:  2016-11-29       Impact factor: 15.419

  4 in total

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