| Literature DB >> 17090074 |
Hagai Cohen1, Rivka Maoz, Jacob Sagiv.
Abstract
Charge accumulation in an organosilane monolayer self-assembled on silicon is studied using electron-spectroscopy-based chemically resolved electrical measurements (CREM). By resolving the net electrical response of the organic layer, a significant capability of holding extra charge is indicated. Quantum size effects at a molecularly thin layer and the role of competing discharge mechanisms, including defect-assisted leakage currents, are discussed.Entities:
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Year: 2006 PMID: 17090074 DOI: 10.1021/nl061749w
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189