| Literature DB >> 17079081 |
Abstract
We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.Year: 2006 PMID： 17079081 DOI： 10.1016/j.ultramic.2006.09.002
Source DB: PubMed Journal: Ultramicroscopy ISSN： 0304-3991 Impact factor: 2.689