| Literature DB >> 16934930 |
P L Potapov1, H Lichte, J Verbeeck, D van Dyck.
Abstract
Using the combination of an electron biprism and an energy filter, the coherence distribution in an inelastically scattered wave-field is measured. It is found that the degree of coherence decreases rapidly with increasing distance between two superimposed points in the object, and with increasing energy-loss. In a Si sample, coherence of plasmon scattering increases in vacuum with the distance from the edge of the sample.Entities:
Year: 2006 PMID: 16934930 DOI: 10.1016/j.ultramic.2006.05.012
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689