| Literature DB >> 16907593 |
M Schmid1, M Shishkin, G Kresse, E Napetschnig, P Varga, M Kulawik, N Nilius, H-P Rust, H-J Freund.
Abstract
A model for the straight antiphase domain boundary of the ultrathin aluminum oxide film on the NiAl(110) substrate is derived from scanning tunneling microscopy measurements and density-functional theory calculations. Although the local bonding environment of the perfect film is maintained, the structure is oxygen deficient and possesses a favorable adsorption site. The domain boundary exhibits a downwards band bending and three characteristic unoccupied electronic states, in excellent agreement with scanning tunneling spectroscopy measurements.Entities:
Year: 2006 PMID: 16907593 DOI: 10.1103/PhysRevLett.97.046101
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161