| Literature DB >> 16907257 |
J B Hannon1, J Sun, K Pohl, G L Kellogg.
Abstract
A key challenge in thin-film growth is controlling structure and composition at the atomic scale. We have used spatially resolved electron scattering to measure how the three-dimensional composition profile of an alloy film evolves with time at the nanometer length scale. We show that heterogeneity during the growth of Pd on Cu(001) arises naturally from a generic step-overgrowth mechanism relevant in many growth systems.Year: 2006 PMID: 16907257 DOI: 10.1103/PhysRevLett.96.246103
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161