Literature DB >> 16907257

Origins of nanoscale heterogeneity in ultrathin films.

J B Hannon1, J Sun, K Pohl, G L Kellogg.   

Abstract

A key challenge in thin-film growth is controlling structure and composition at the atomic scale. We have used spatially resolved electron scattering to measure how the three-dimensional composition profile of an alloy film evolves with time at the nanometer length scale. We show that heterogeneity during the growth of Pd on Cu(001) arises naturally from a generic step-overgrowth mechanism relevant in many growth systems.

Year:  2006        PMID: 16907257     DOI: 10.1103/PhysRevLett.96.246103

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  1 in total

1.  Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy.

Authors:  Johannes Jobst; Alexander J H van der Torren; Eugene E Krasovskii; Jesse Balgley; Cory R Dean; Rudolf M Tromp; Sense Jan van der Molen
Journal:  Nat Commun       Date:  2016-11-29       Impact factor: 14.919

  1 in total

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