Literature DB >> 16852476

Microscopic insights into the sputtering of thin organic films on Ag{111} induced by C60 and Ga bombardment.

Zbigniew Postawa1, Bartlomiej Czerwinski, Nicholas Winograd, Barbara J Garrison.   

Abstract

Molecular dynamics computer simulations have been employed to model the bombardment of Ag{111} covered with three layers of C6H6 by 15 keV Ga and C60 projectiles. The study is aimed toward examining the mechanism by which molecules are desorbed from surfaces by energetic cluster ion beams and toward elucidating the differences between cluster bombardment and atom bombardment. The results show that the impact of the cluster on the benzene-covered surface leads to molecular desorption during the formation of a mesoscopic scale impact crater via a catapulting mechanism. Because of the high yield of C6H6 with both Ga and C60, the yield enhancement is observed to be consistent with related experimental observations. Specific energy and angle distributions are shown to be associated with the catapult mechanism.

Entities:  

Year:  2005        PMID: 16852476     DOI: 10.1021/jp050821w

Source DB:  PubMed          Journal:  J Phys Chem B        ISSN: 1520-5207            Impact factor:   2.991


  20 in total

1.  Characteristic fragmentation of polysiloxane monolayer films by bombardment with monatomic and polyatomic primary ions in TOF-SIMS.

Authors:  Hye Kyoung Moon; David D Wells; Joseph A Gardella
Journal:  J Am Soc Mass Spectrom       Date:  2011-10-25       Impact factor: 3.109

2.  ToF-SIMS Analysis of Adsorbed Proteins: Principal Component Analysis of the Primary Ion Species Effect on the Protein Fragmentation Patterns.

Authors:  Shin Muramoto; Daniel J Graham; Matthew S Wagner; Tae Geol Lee; Dae Won Moon; David G Castner
Journal:  J Phys Chem C Nanomater Interfaces       Date:  2011-12-15       Impact factor: 4.126

3.  Higher sensitivity secondary ion mass spectrometry of biological molecules for high resolution, chemically specific imaging.

Authors:  Liam A McDonnell; Ron M A Heeren; Robert P J de Lange; Ian W Fletcher
Journal:  J Am Soc Mass Spectrom       Date:  2006-06-12       Impact factor: 3.109

4.  Multivariate analysis strategies for processing ToF-SIMS images of biomaterials.

Authors:  Bonnie J Tyler; Gaurav Rayal; David G Castner
Journal:  Biomaterials       Date:  2007-02-09       Impact factor: 12.479

5.  ToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth Profiles.

Authors:  Shin Muramoto; Jeremy Brison; David Castner
Journal:  Surf Interface Anal       Date:  2011-01       Impact factor: 1.607

6.  Depth-profiling X-ray photoelectron spectroscopy (XPS) analysis of interlayer diffusion in polyelectrolyte multilayers.

Authors:  Jonathan B Gilbert; Michael F Rubner; Robert E Cohen
Journal:  Proc Natl Acad Sci U S A       Date:  2013-04-08       Impact factor: 11.205

7.  ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis.

Authors:  J Brison; S Muramoto; David G Castner
Journal:  J Phys Chem C Nanomater Interfaces       Date:  2010-01-05       Impact factor: 4.126

Review 8.  Biological cluster mass spectrometry.

Authors:  Nicholas Winograd; Barbara J Garrison
Journal:  Annu Rev Phys Chem       Date:  2010       Impact factor: 12.703

Review 9.  Application of surface chemical analysis tools for characterization of nanoparticles.

Authors:  D R Baer; D J Gaspar; P Nachimuthu; S D Techane; D G Castner
Journal:  Anal Bioanal Chem       Date:  2010-01-06       Impact factor: 4.142

10.  Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry.

Authors:  Leiliang Zheng; Andreas Wucher; Nicholas Winograd
Journal:  J Am Soc Mass Spectrom       Date:  2008-01       Impact factor: 3.109

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