| Literature DB >> 16775635 |
Kazufumi Sakai1, Toshiaki Koga, Yusuke Imai, Shouko Maehara, Chao-Nan Xu.
Abstract
We have invented a new device based on atomic force microscopy that measures the emission from a single microparticle by force direct application using the AFM probe, and successfully observed emission in the region of the elastic deformation, friction, and destructive deformation.Mesh：
Substances：
Year: 2006 PMID： 16775635 DOI： 10.1039/b604656h
Source DB: PubMed Journal: Phys Chem Chem Phys ISSN： 1463-9076 Impact factor: 3.676