Literature DB >> 16774370

Ellipsometric identification of collective optical properties of silver nanocrystal arrays.

Herbert Wormeester1, Anne-Isabelle Henry, E Stefan Kooij, Bene Poelsema, Marie-Paule Pileni.   

Abstract

The optical properties of silver nanocrystal arrays are investigated using spectroscopic ellipsometry in combination with polarized reflection measurements. Analysis of the ellipsometry and reflectometry spectra in terms of the "thin island film" theory enables a transparent identification of the contribution of collective effects to the optical response. Negligible image charge effects imply that only dipole contributions have to be considered. The interactions between the hexagonally ordered silver nanocrystals give rise to an effective modification of the spherical response to oblate entities with different polarizabilities parallel and perpendicular to the substrate, expressed in terms of corresponding depolarization factors. The effect of nanocrystal ordering, nearest-neighbor distance, size distribution, surrounding ambient, and the optical properties of the single nanocrystals on the optical response are analyzed. The extent of plasmon resonance peak splitting as a function of surface coverage is discussed.

Entities:  

Year:  2006        PMID: 16774370     DOI: 10.1063/1.2200647

Source DB:  PubMed          Journal:  J Chem Phys        ISSN: 0021-9606            Impact factor:   3.488


  1 in total

1.  Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives.

Authors:  Maria Losurdo; Michael Bergmair; Giovanni Bruno; Denis Cattelan; Christoph Cobet; Antonello de Martino; Karsten Fleischer; Zorana Dohcevic-Mitrovic; Norbert Esser; Melanie Galliet; Rados Gajic; Dušan Hemzal; Kurt Hingerl; Josef Humlicek; Razvigor Ossikovski; Zoran V Popovic; Ottilia Saxl
Journal:  J Nanopart Res       Date:  2009-06-12       Impact factor: 2.253

  1 in total

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