Rapid mapping of texture in polycrystalline materials using an imaging plate on a synchrotron radiation source.

Taking advantage of the high brilliance of synchrotron radiation, a system was developed for rapid mapping of the orientation distribution of crystal grains (texture) in polycrystalline materials using an imaging plate. A monochromatized beam is incident on the sample, which is rotated using the omega-axis mechanism of an X-ray diffractometer so that the surface of the sphere of poles of the selected reflection is scanned by the Ewald sphere. Simultaneously, the imaging plate is translated vertically with a velocity that is synchronized with that of the sample rotation. It is possible to record pole figures over an extended angular range within a short period of time, typically of the order of minutes. The method has been applied to the observation of a time change in the orientation distribution of metal sheets at elevated temperatures.