Literature DB >> 16702676

New features of dislocation images in third-generation synchrotron radiation topographs.

F Zontone, L Mancini, R Barrett, J Baruchel, J Härtwig, Y Epelboin.   

Abstract

Some aspects of the dislocation contrast observed at third-generation synchrotron radiation set-ups are presented. They can be explained by taking into account angular deviation effects on the beam propagation, which are visible because of the ;almost plane-wave' character of these sources. In particular, we show how the evolution of the direct image width of a dislocation as a function of the sample-to-film distance can allow a complete determination of the Burgers vector, i.e. in sign and modulus. In addition, experimental results obtained in monochromatic beam topography are compared with simulated images calculated assuming plane-wave illumination and are demonstrated to show a satisfactory agreement. The utility of the weak-beam technique in enhancing the spatial resolution is demonstrated and a criterion for the selection of experimental conditions depending upon the required spatial resolution, signal-to-noise ratio and exposure time is presented.

Year:  1996        PMID: 16702676     DOI: 10.1107/S0909049596002269

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN: 0909-0495            Impact factor:   2.616


  1 in total

1.  Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging.

Authors:  M G Tsoutsouva; V A Oliveira; J Baruchel; D Camel; B Marie; T A Lafford
Journal:  J Appl Crystallogr       Date:  2015-04-16       Impact factor: 3.304

  1 in total

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