| Literature DB >> 16606046 |
L-C Duda1, T Schmitt, M Magnuson, J Forsberg, A Olsson, J Nordgren, K Okada, A Kotani.
Abstract
We report high-resolution polarization-dependent resonant inelastic x-ray scattering (RIXS) at the O K resonance of NiO showing a rich excitation spectrum. We perform multisite Ni6O19 cluster model calculations, revealing that solid state effects are substantial. We identify a nonlocal charge transfer excitation at 4-5 eV and double-singlet creation at 1.75 eV, both exhibiting significant scattering geometry dependence. Apart from an intense band of local charge transfer excitations (above 5 eV) also dd excitations at 1 eV are observed. Finally, we point out that O K RIXS of correlated metal oxides allows a quantitative and consistent determination of the charge transfer energy delta and the Hund coupling energy J(H).Entities:
Year: 2006 PMID: 16606046 DOI: 10.1103/PhysRevLett.96.067402
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161