Laser ablation and secondary ion mass spectrometry of inorganic transition-metal compounds. Part I: comparison between static ToF-SIMS and LA-FTICRMS.

Most of the first-row transition-metal oxides, M(A)O(B) (M = Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn) were examined by static secondary ion mass spectrometry (s-SIMS) and laser ablation/ionization Fourier transform ion cyclotron resonance mass spectrometry (LA-FTICRMS). Positive and negative ions show strong correlation between the studied oxide and the detected cluster ions. Specific M(x)O(y) (+/-) species were systematically observed with both MS techniques for each investigated M(A)O(B) transition-metal oxide. Moreover, the ion composition and ion distribution are greatly dependent on the ionization technique. Laser ablation (LA)/ionization leads to larger cluster ions (ionic species with nearly hundred atoms were in particular detected for Sc2O3 and Y2O3 oxides), whereas hydrogenated, dihydrogenated, and sometimes trihydrogenated species were observed in s-SIMS. However, the ion distribution for a given M(x)O(y) (+/-) ion series (i.e. ions including the same number of metal atoms M) generally presented important similarities in both techniques.Finally, it was demonstrated that the chemical state of metal atoms in the observed ionic species is closely dependent on the metal electronic valence shell. High valence states (+III, +IV, +V, and +VI) are favored for metals with a less-than-half full valence shell configuration, whereas for other first-row transition metals (manganese, iron, cobalt, nickel, copper and zinc) lower metal valence states (0, +I or, +II) are involved. Copyright (c) 2006 John Wiley & Sons, Ltd.