| Literature DB >> 16522023 |
Liang Wang1, Sreemanth M Uppuluri, Eric X Jin, Xianfan Xu.
Abstract
We demonstrate that bowtie apertures can be used for contact lithography to achieve nanometer scale resolution. The bowtie apertures with a 30 nm gap size are fabricated in aluminum thin films coated on quartz substrates. Lithography results show that holes of sub-50-nm dimensions can be produced in photoresist by illuminating the apertures with a 355 nm laser beam polarized in the direction across the gap. Experimental results show enhanced transmission and light concentration of bowtie apertures compared to square and rectangular apertures of the same opening area. Finite different time domain simulations are used to explain the experimental results.Entities:
Year: 2006 PMID: 16522023 DOI: 10.1021/nl052371p
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189