| Literature DB >> 16463500 |
Ville Kaajakari1, Jukka K Koskinen, Tomi Mattila.
Abstract
Phase noise in capacitively coupled microresonator-based oscillators is investigated. A detailed analysis of noise mixing mechanisms in the resonator is presented, and the capacitive transduction is shown to be the dominant mechanism for low-frequency 1/f-noise mixing into the carrier sidebands. Thus, the capacitively coupled micromechanical resonators are expected to be more prone to the 1/f-noise aliasing than piezoelectrically coupled resonators. The analytical work is complemented with simulations, and a highly efficient and accurate simulation method for a quantitative noise analysis in closed-loop oscillator applications is presented. Measured phase noise for a microresonator-based oscillator is found to agree with the developed analytical and simulated noise models.Year: 2005 PMID: 16463500 DOI: 10.1109/tuffc.2005.1563277
Source DB: PubMed Journal: IEEE Trans Ultrason Ferroelectr Freq Control ISSN: 0885-3010 Impact factor: 2.725