Literature DB >> 16411177

Masking selected sequence variation by incorporating mismatches into melting analysis probes.

Rebecca L Margraf1, Rong Mao, Carl T Wittwer.   

Abstract

Hybridization probe melting analysis can be complicated by the presence of sequence variation (benign polymorphisms or other mutations) near the targeted mutation. We investigated the use of "masking" probes to differentiate alleles with similar probe melting temperatures. Selected sequence variation was masked by incorporating mismatches (deletion, unmatched nucleotide, or universal base) into hybridization probes at the polymorphic location. Such masking probes create a probe/target mismatch with all possible alleles at the selected polymorphic location. Any allele with additional variation at another site is identified by a lower probe melting temperature than alleles that vary only at the masked position. This "masking technique" was applied to RET protooncogene and HPA6 mutation detection using unlabeled hybridization probes, a saturating dsDNA dye, and high-resolution melting analysis. Masking probes clearly distinguished all targeted mutations from polymorphisms when at least 1 base pair (bp) separated the mutation from the masked variation. We were able to mask polymorphisms immediately adjacent to mutations, except in certain cases, such as those involving single-base deletion probes when both adjacent positions had the same polymorphic nucleotides. The masking probes can also localize mutations to specific codons or nucleotide positions. Masking probes can simplify melting analysis of complex regions and eliminate the need for sequencing. 2006 Wiley-Liss, Inc.

Entities:  

Mesh:

Substances:

Year:  2006        PMID: 16411177     DOI: 10.1002/humu.20290

Source DB:  PubMed          Journal:  Hum Mutat        ISSN: 1059-7794            Impact factor:   4.878


  8 in total

1.  Robustness of single-base extension against mismatches at the site of primer attachment in a clinical assay.

Authors:  Holger Kirsten; Daniel Teupser; Jana Weissfuss; Grit Wolfram; Frank Emmrich; Peter Ahnert
Journal:  J Mol Med (Berl)       Date:  2006-12-08       Impact factor: 4.599

2.  RET proto-oncogene genotyping using unlabeled probes, the masking technique, and amplicon high-resolution melting analysis.

Authors:  Rebecca L Margraf; Rong Mao; W Edward Highsmith; Leonard M Holtegaard; Carl T Wittwer
Journal:  J Mol Diagn       Date:  2007-04       Impact factor: 5.568

3.  Characterization of aberrant melting peaks in unlabeled probe assays.

Authors:  Shale Dames; Rebecca L Margraf; David C Pattison; Carl T Wittwer; Karl V Voelkerding
Journal:  J Mol Diagn       Date:  2007-07       Impact factor: 5.568

4.  LightCycler technology in molecular diagnostics.

Authors:  Elaine Lyon; Carl T Wittwer
Journal:  J Mol Diagn       Date:  2009-02-05       Impact factor: 5.568

Review 5.  High resolution melting applications for clinical laboratory medicine.

Authors:  Maria Erali; Karl V Voelkerding; Carl T Wittwer
Journal:  Exp Mol Pathol       Date:  2008-04-13       Impact factor: 3.362

6.  Rapid Detection of Common HIV-1 Drug Resistance Mutations by Use of High-Resolution Melting Analysis and Unlabeled Probes.

Authors:  David Sacks; Johanna Ledwaba; Lynn Morris; Gillian M Hunt
Journal:  J Clin Microbiol       Date:  2016-12-28       Impact factor: 5.948

7.  Detection of Anti-Hepatitis B Virus Drug Resistance Mutations Based on Multicolor Melting Curve Analysis.

Authors:  Yi Mou; Muhammad Ammar Athar; Yuzhen Wu; Ye Xu; Jianhua Wu; Zhenxing Xu; Zulfiqar Hayder; Saeed Khan; Muhammad Idrees; Muhammad Israr Nasir; Yiqun Liao; Qingge Li
Journal:  J Clin Microbiol       Date:  2016-08-17       Impact factor: 5.948

8.  Analysis of multiple single nucleotide polymorphisms closely positioned in the ovine PRNP gene using linear fluorescent probes and melting curve analysis.

Authors:  David J French; Dominic Jones; David G McDowell; Jim A Thomson; Paul G Debenham
Journal:  BMC Infect Dis       Date:  2007-08-03       Impact factor: 3.090

  8 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.