| Literature DB >> 16376557 |
Xiaoyan Xing1, Kaibo Zheng, Huahua Xu, Fang Fang, Haoting Shen, Jing Zhang, Jian Zhu, Chunnuan Ye, Guanying Cao, Dalin Sun, Guorong Chen.
Abstract
Vertically aligned ZnO nanowires were synthesized on the p(+) silicon chip by modifying the CVD process with a vapor trapping design. Scanning electron microscopy was used to investigate the morphology of as-obtained nanowires. X-ray diffraction showed that the obtained nanowires were ZnO crystalline. The rectifying characteristics of the p-n heterojunction composed of ZnO nanowires and a p(+) silicon chip were observed. The positive turn-on voltage was 0.5V and the reverse saturation current was 0.01mA. These vertically aligned ZnO nanowires showed a low field emission threshold of 4V/microm at a current density of 0.1microA/cm(2). The dependence of emission current density on the electric field followed Fowler-Nordheim relationship.Entities:
Year: 2005 PMID: 16376557 DOI: 10.1016/j.micron.2005.10.010
Source DB: PubMed Journal: Micron ISSN: 0968-4328 Impact factor: 2.251