Literature DB >> 16285440

Multistage chemical etching for high-precision frequency adjustment in ultrahigh-frequency fundamental quartz resonators.

Hirokazu Iwata1.   

Abstract

Chemical etching to precisely adjust and to make uniform the thicknesses of vibrating areas of multiple resonators in a single wafer was applied to inverted-mesa quartz resonators exciting an ultrahigh-frequency fundamental thickness vibration. The process consisted of five stages, combining high-rate etching for high productivity and low-rate etching for high-precision adjustment. By using this process, the resonance frequencies of 41 resonators in the single wafer were adjusted to 620 +/- 1.5 MHz, which corresponds to vibrating area thicknesses of 2.2 microm +/- 6 nm. In the temperature-frequency characteristics of these resonators in the single wafer, the difference between the maximum first-order temperature coefficient and the minimum first-order temperature coefficient was equivalent to a cut angle change of two arcminutes. In addition, vibrating areas with an arithmetic mean surface roughness of 0.17 nm on the concave side were produced by this multistage etching.

Year:  2005        PMID: 16285440     DOI: 10.1109/tuffc.2005.1516014

Source DB:  PubMed          Journal:  IEEE Trans Ultrason Ferroelectr Freq Control        ISSN: 0885-3010            Impact factor:   2.725


  1 in total

1.  Friction-induced nanofabrication method to produce protrusive nanostructures on quartz.

Authors:  Chenfei Song; Xiaoying Li; Bingjun Yu; Hanshan Dong; Linmao Qian; Zhongrong Zhou
Journal:  Nanoscale Res Lett       Date:  2011-04-07       Impact factor: 4.703

  1 in total

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