Literature DB >> 16241667

Distortion and segregation in a dislocation core region at atomic resolution.

X Xu1, S P Beckman, P Specht, E R Weber, D C Chrzan, R P Erni, I Arslan, N Browning, A Bleloch, C Kisielowski.   

Abstract

The structure of an isolated, Ga terminated, 30 degree partial dislocation in GaAs:Be is determined by high resolution transmission electron microscopes and focal series reconstruction. The positions of atomic columns in the core region are measured to an accuracy of better than 10 pm. A quantitative comparison of the structure predicted by an ab initio electronic structure total energy calculation to the experiment indicates that theory and experiment agree to within 20 pm. Further analysis shows the deviations between theory and experiment appear to be systematic. Electron energy loss spectroscopy establishes that defects segregate to the core region, thus accounting for the systematic deviations.

Entities:  

Year:  2005        PMID: 16241667     DOI: 10.1103/PhysRevLett.95.145501

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  2 in total

1.  Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering.

Authors:  Changkui Hu; Qiong Chen; Fengxiang Chen; T H Gfroerer; M W Wanlass; Yong Zhang
Journal:  Light Sci Appl       Date:  2018-06-20       Impact factor: 17.782

2.  Atomic configurations at InAs partial dislocation cores associated with Z-shape faulted dipoles.

Authors:  Luying Li; Zhaofeng Gan; Martha R McCartney; Hanshuang Liang; Hongbin Yu; Yihua Gao; Jianbo Wang; David J Smith
Journal:  Sci Rep       Date:  2013-11-15       Impact factor: 4.379

  2 in total

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