| Literature DB >> 16208914 |
Yinlan Ruan1, Barry Luther-Davies, Weitang Li, Andrei Rode, Vesslin Kolev, Steve Madden.
Abstract
A large phase shift of 4.7pi at 1.53 microm has been observed from a low-loss (0.2 dB/cm), small-core As2S3 waveguide fabricated by dry etching. The strength of the nonlinear response was limited by photosensitivity and photocrystallization of the As2S3 films at 1.53 microm, far below the material bandgap.Entities:
Year: 2005 PMID： 16208914 DOI： 10.1364/ol.30.002605
Source DB: PubMed Journal: Opt Lett ISSN： 0146-9592 Impact factor: 3.776