Literature DB >> 16143703

Dark-field transmission electron microscopy for a tilt series of ordering alloys: toward electron tomography.

Kousuke Kimura, Satoshi Hata, Syo Matsumura, Takao Horiuchi.   

Abstract

Here we show a technique to obtain a tilt series of dark-field (DF) transmission electron microscopy (TEM) images in ordering alloys for tomographic three-dimensional (3D) observations. A tilt series of DF TEM images of D1a-ordered Ni4Mo precipitates in a Ni-Mo alloy was successfully obtained by adjusting a diffraction condition for a superlattice reflection from the Ni4Mo precipitates. Since the superlattice reflection usually has a long extinction distance, dynamic diffraction effects such as thickness fringes can be suppressed to some extent with precise realignment of the diffraction condition. By using the tilt series of the DF TEM images, we attempted a computed TEM tomography to visualize 3D shapes and positions of the precipitates.

Entities:  

Year:  2005        PMID: 16143703     DOI: 10.1093/jmicro/dfi060

Source DB:  PubMed          Journal:  J Electron Microsc (Tokyo)        ISSN: 0022-0744


  1 in total

1.  Electron tomography imaging methods with diffraction contrast for materials research.

Authors:  Satoshi Hata; Hiromitsu Furukawa; Takashi Gondo; Daisuke Hirakami; Noritaka Horii; Ken-Ichi Ikeda; Katsumi Kawamoto; Kosuke Kimura; Syo Matsumura; Masatoshi Mitsuhara; Hiroya Miyazaki; Shinsuke Miyazaki; Mitsu Mitsuhiro Murayama; Hideharu Nakashima; Hikaru Saito; Masashi Sakamoto; Shigeto Yamasaki
Journal:  Microscopy (Oxf)       Date:  2020-05-21       Impact factor: 1.571

  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.