| Literature DB >> 15943455 |
X-M Yan1, A M Contreras, M M Koebel, J A Liddle, G A Somorjai.
Abstract
Using low-pressure chemical vapor deposition of silicon dioxide, we have reduced the size of 56-nm features in a silicon nitride membrane, called a stencil, down to 36 nm. Sub-50-nm uniformly sized nanoparticles are fabricated by electron-beam deposition of Pt through the stencil mask. A self-assembled monolayer (SAM) of tridecafluoro-1,1,2,2-tetrahydrooctyl-1-trichlorosilane was used to reduce Pt clogging of the nanosize holes during deposition as well as to protect the stencil during the postdeposition Pt removal. X-ray photoelectron spectroscopy shows that the SAM protects the stencil efficiently during this postdeposition removal of Pt.Entities:
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Year: 2005 PMID: 15943455 DOI: 10.1021/nl0506812
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189