Literature DB >> 15907002

Characterization of ultrashort electron pulses by electron-laser pulse cross correlation.

Bradley J Siwick1, Alexander A Green, Christoph T Hebeisen, R J Dwayne Miller.   

Abstract

An all-optical method to determine the duration of ultrashort electron pulses is presented. This technique makes use of the laser pulse ponderomotive potential to effectively sample the temporal envelope of the electron pulse by sequentially scattering different sections of the pulse out of the main beam. Using laser pulse parameters that are easily accessible with modern tabletop chirped-pulse amplification laser sources, it is possible to measure the instantaneous duration of electron pulses shorter than 100 fs in the energy range that is most useful for electron diffraction studies, 10-300 keV.

Year:  2005        PMID: 15907002     DOI: 10.1364/ol.30.001057

Source DB:  PubMed          Journal:  Opt Lett        ISSN: 0146-9592            Impact factor:   3.776


  2 in total

1.  Breaking resolution limits in ultrafast electron diffraction and microscopy.

Authors:  Peter Baum; Ahmed H Zewail
Journal:  Proc Natl Acad Sci U S A       Date:  2006-10-20       Impact factor: 11.205

2.  Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers.

Authors:  D S Badali; R Y N Gengler; R J D Miller
Journal:  Struct Dyn       Date:  2016-05-12       Impact factor: 2.920

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.