| Literature DB >> 15792429 |
R V Seidel1, A P Graham, J Kretz, B Rajasekharan, G S Duesberg, M Liebau, E Unger, F Kreupl, W Hoenlein.
Abstract
Carbon nanotube field-effect transistors with sub-20 nm long channels and on/off current ratios of >10(6) are demonstrated. Individual single-walled carbon nanotubes with diameters ranging from 0.7 to 1.1 nm grown from structured catalytic islands using chemical vapor deposition at 700 degrees C form the channels. Electron beam lithography and a combination of HSQ, calix[6]arene, and PMMA e-beam resists were used to structure the short channels and source and drain regions. The nanotube transistors display on-currents in excess of 15 microA for drain-source biases of only 0.4 V.Entities:
Year: 2005 PMID: 15792429 DOI: 10.1021/nl048312d
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189