Literature DB >> 15783662

Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite.

S Hembacher1, F J Giessibl, J Mannhart, C F Quate.   

Abstract

Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obtained in an attractive AFM mode should therefore be redundant because they should be similar to STM. Here, we show that while the distance dependence of current and force is similar for graphite, constant-height AFM and STM images differ substantially depending on the distance and bias voltage. We perform spectroscopy of the tunneling current, the frequency shift, and the damping signal at high-symmetry lattice sites of the graphite (0001) surface. The dissipation signal is about twice as sensitive to distance as the frequency shift, explained by the Prandtl-Tomlinson model of atomic friction.

Entities:  

Year:  2005        PMID: 15783662     DOI: 10.1103/PhysRevLett.94.056101

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  5 in total

1.  Three-dimensional imaging of short-range chemical forces with picometre resolution.

Authors:  Boris J Albers; Todd C Schwendemann; Mehmet Z Baykara; Nicolas Pilet; Marcus Liebmann; Eric I Altman; Udo D Schwarz
Journal:  Nat Nanotechnol       Date:  2009-04-06       Impact factor: 39.213

2.  Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.

Authors:  Fabien Castanié; Laurent Nony; Sébastien Gauthier; Xavier Bouju
Journal:  Beilstein J Nanotechnol       Date:  2012-04-02       Impact factor: 3.649

3.  Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy.

Authors:  Majid Fazeli Jadidi; Umut Kamber; Oğuzhan Gürlü; H Özgür Özer
Journal:  Beilstein J Nanotechnol       Date:  2018-11-28       Impact factor: 3.649

4.  Very-high-frequency probes for atomic force microscopy with silicon optomechanics.

Authors:  L Schwab; P E Allain; N Mauran; X Dollat; L Mazenq; D Lagrange; M Gély; S Hentz; G Jourdan; I Favero; B Legrand
Journal:  Microsyst Nanoeng       Date:  2022-03-18       Impact factor: 7.127

5.  Characterization of the mechanical properties of qPlus sensors.

Authors:  Jan Berger; Martin Svec; Martin Müller; Martin Ledinský; Antonín Fejfar; Pavel Jelínek; Zsolt Majzik
Journal:  Beilstein J Nanotechnol       Date:  2013-01-02       Impact factor: 3.649

  5 in total

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